Cathodoluminescence
Explore optical and electronic properties through correlated electron microscopy and optical signals.
Advanced electron microscopy and multidimensional characterization, backed by instrument expertise and application support for research and industry.
XBOUND focuses on advanced electron microscopy and multidimensional characterization. Our instrument platforms and application expertise connect electron microscopy, in situ analysis and correlative techniques for research and industry. Our portfolio includes Delmic cathodoluminescence, NenoVision AFM-in-SEM, and Waviks in situ laser heating and optical excitation systems.
Electron microscopy
In situ analysis
Correlative microscopy
Multidimensional characterization
Tailored solutionsFrom static observation to dynamic processes, and from single signals to multidimensional information, we explore new research possibilities by extending SEM and TEM capabilities.
Partnering with global leaders in characterization
Explore optical and electronic properties through correlated electron microscopy and optical signals.
Measure nanoscale surface topography and mechanical properties inside an electron microscope.
Investigate dynamic material behavior under controlled heating and optical excitation.
Expand your microscope with in situ capabilities and multimodal correlation.
Technical advice based on your research needs
Support informed by your experiments
Customized domestic equipment solutions
Hands-on demonstrations in Shanghai
Product and application training
Ongoing nationwide support
From instruments to applications and research, we share case studies, journal articles, technical videos and webinars to help researchers discover valuable insights.
We will recommend solutions and testing approaches based on your application. We usually respond within one business day.