BEYOND THE MICROSCALE

Greater possibilities at the microscale

Advanced electron microscopy and multidimensional characterization.

Expand your in situ, spectral and correlative analysis capabilities.

Find your solution in three steps

Match technologies and products to your research field, scientific questions and sourcing requirements.

01

What is your research field?

Select your application area

02

What do you need to investigate?

Select your scientific question or technical need

Applications

Case studies · Publication · Related webinars and journals

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Zircon CL imaging

Zircon CL imaging

Delmic Material Sciences addresses nanoscale optical and electronic properties with automated advanced cathodoluminescence (CL) imaging

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Global partners

Partnering with global leaders in characterization

Why XBOUND

Partnering with global leaders in characterization

01

Advanced global technologies

We bring international innovations in CL, AFM-in-SEM, in situ TEM, advanced microscopy and TEM sample preparation to academic and industrial users.

02

Start with your scientific question

We match solutions to your research field, scientific question and sourcing needs, helping clarify your objectives before selecting technologies and instruments.

03

Shanghai Demo & Application Center

Local demonstrations and application experiments help you assess instruments, validate methods and see results before purchasing.

04

Ongoing application support

Our application engineers support you from solution planning and demonstrations to sample testing and ongoing application assistance.

Resources

Partnering with global leaders in characterization

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Tell us about your samples and research questions

We will recommend solutions and testing approaches based on your application. We usually respond within one business day.

24 hour service

021-3358 6350