Applications

Expand your microscope with in situ capabilities and multimodal correlation.

Dislocation Mapping in GaN

SPARC 3.0's monochromatic intensity mode enables users to develop quantitative, high-throughput CLs at precisely set wavelengths Intensity is plotted. This imaging mode complements the existing CL Intensity and spectral modes provide greater flexibility to customize experimental protocols for specific research questions.
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Dislocation Mapping in GaN

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