Products

Expand your microscope with in situ capabilities and multimodal correlation.

NenoVision

LiteScope AFM-in-SEM

SEM navigation probe to locate areas of interest
AFM obtains the three-dimensional morphology of the surface and corresponding measurement information
CPEM correlates SEM and AFM data;
Measurement mode depends on probe, module and configuration

Product introduction

LiteScope AFM-in-SEM: In-situ correlation analysis of atomic force and electron microscopy within the SEM

Please replace the demonstration points and formal specifications in the original static product card with confirmation information.

Please replace the demonstration points and formal specifications in the original static product card with confirmation information.

Please replace the demonstration points and formal specifications in the original static product card with confirmation information.

Please replace the demonstration points and formal specifications in the original static product card with confirmation information.

SEM precise positioning + AFM morphology + 3D correlation

We will recommend solutions and testing approaches based on your application. We usually respond within one business day.