NenoVision LiteScope Atomic Force Microscope (AFM-In-SEM) is an in-situ multimodal correlation analysis system designed for scanning electron microscopy (SEM). It can be seamlessly embedded in the mainstream SEM cavity, and the AFM and SEM data can be synchronized in the same environment and position by accurately positioning the probe from the real-time viewing angle of the electron microscope. The system is widely used in materials science and nanotechnology, semiconductors and micro and nanoelectronic devices, life sciences and biomedicine, and energy, energy storage and catalysis research.