XBOUND Named Authorized Delmic CL Distributor in China
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XBOUND and Delmic Enabling cathodoluminescence Characterization
XBOUND X Delmic CL (Official
XBOUND Characterization Technology officially entered into a strategic cooperation with Delmic CL to become its authorized agent in China. This marks a milestone for us - empowering China's scientific community with an internationally-leading Cathodoluminescence (CL) solution that opens up entirely new possibilities in nanoscale characterization.
Together with the Delmic CL team, we will bring to Chinese users:
01| Deep localization support
With its deep technical accumulation and extensive industry network, XBOUND Characterization Technology will provide Chinese universities, research institutes and high-tech industries with seamless sales, rapid response services, and tailored application support.
02| Extreme technical precision
Through this collaboration, XBOUND provides researchers with a market-leading Delmic cathode luminescent detector. Designed for photonics, semiconductors and geology, this product delivers unprecedentedSpectral Resolution, Angular Resolution and Spatial Resolution。
03| Accelerating scientific breakthroughs
Combining Delmic's cutting-edge optical capabilities with XBOUND's unbounded access to front-line market insights, we will enable complex electron microscopy characterizationFaster, clearer, more accessible。
“China has always been at the forefront of materials science and semiconductor innovation. Together with XBOUND, we are able to deliver high-performance CL technology to our users, along with the localized expertise needed to accelerate next-generation scientific research.”
Contact us today to learn how Cathodoluminescence (CL) upgrades a standard SEM workflow to a powerful platform for optical characterization. The XBOUND team will provide you with local product demonstrations and technical support in China to answer your technical questions at any time.
Delmic Cathodoluminescence Technology Series Products
SPARC Spectral
SPARC Compact
JOLT
Hotline: 8621-3358 6350
XBOUND Characterization Technology is committed to exploring the microscopic world boundaries, focusing on advanced electron microscopy and multi-dimensional characterization technology. Through innovative instrument platforms and professional solutions, electronic microscopy, in-situ analysis, photoelectric correlation and intelligent characterization technologies are connected, providing unlimited possibilities for scientific research and industrial innovation.At present, we mainly provide the following products: advanced SEM/TEM accessories such as Delmic cathodoluminescence in the Netherlands, NenoVision electron microscope atomic force microscope in the Czech Republic, and Waviks in-situ laser heating and light excitation system in the United States. At present, there is a demo experience center in Shanghai, and after-sales service covers the whole country.
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021-3358 6350